Operator Name :Mrs. Debashree Majumdar
Operator Email :debashreesardar2008@gmail.com
Operator Contact :9748510108
The X-Ray diffractometer. unit provides the measure of crystallinity of a material. The diffraction pattern of X-ray (wavelength 0.1-100 Å), when interacted with the material is analyzed with the help of standard JCPDS data file to find out the structure of the material lattice and planes.