The experimental set up consists of probe arrangement, sample , oven 0-200°C, constant current generator , oven power supply and digital panel meter(measuring voltage and current). Four probe apparatus is one of the standard and most widely used apparatus for the measurement of resistivity of semiconductors.
This method is employed when the sample is in the form of a thin wafer, such as a thin semiconductor material deposited on a substrate. The sample is millimeter in size and having a thickness w. It consists of four probe arranged linearly in a straight line at equal distance S from each other. A constant current is passed through the two probes and the potential drop V across the middle two probes is measured. An oven is provided with a heater to heat the sample so that behavior of the sample is studied with increase in temperature.